[180 days] Modern Map Methods in Particle Beam Physics
[180 days] Modern Map Methods in Particle Beam Physics [180 days] Modern Map Methods in Particle Beam Physics

[180 days] Modern Map Methods in Particle Beam Physics

CHI TIẾT SẢN PHẨM

Mã sản phẩm:
9780120147502R180
Tồn kho:
Còn hàng
Nhà xuất bản:
Loại bìa:
Page Fidelity
Ngôn ngữ:
English
Tác giả:
Berz, Martin


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Số lượng

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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