[30 days] System-on-Chip Test Architectures: Nanometer  Design for Testability
[30 days] System-on-Chip Test Architectures: Nanometer  Design for Testability [30 days] System-on-Chip Test Architectures: Nanometer  Design for Testability

[30 days] System-on-Chip Test Architectures: Nanometer Design for Testability

CHI TIẾT SẢN PHẨM

Mã sản phẩm:
9780123739735R150
Tồn kho:
Còn hàng
Nhà xuất bản:
Loại bìa:
Page Fidelity
Ngôn ngữ:
English
Tác giả:
Wang, Laung-Terng; Stroud, Charles E.; Touba, Nur A.


Special Price 853,500 VNĐ

Còn 100,000,000,000,000,000 VNĐ nữa bạn sẽ được miễn phí giao hàngTìm hiểu thêm

Mua hàng số lượng lớn

Thời gian giao hàng Xem thêm

Chính sách đổi trả Xem thêm

Số lượng

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost.

This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.

KEY FEATURES
* Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples.
* Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book.
* Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits.
* Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing.
* Practical problems at the end of each chapter for students.

Sản phẩm liên quan

New
[1825 days] The Quinolones

Quinolones constitute a large class of synthetic antimicrobial agents that are highly effective in t..

6,223,000 VNĐ

New
[150 days] Risk Analysis in Theory and Practice

The objective of this book is to present this analytical framework and to illustrate how it can be u..

2,310,500 VNĐ

New
[1825 days] Inaugural Address

This title is from the Hayes Barton Press "Originals" series, a collection of classic fiction and no..

38,000 VNĐ

New
[1825 days] Advances in Ecological Research: Volume 15

Jarvis and McNaughton provide a cogent example of the impact of physiological studies in ecology. T..

1,853,000 VNĐ

0898536989